Browse "School of Electrical Engineering(전기및전자공학부)" bySubjectXPS

Showing results 1 to 6 of 6

Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study

Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chulresearcher; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08

Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chulresearcher, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35, 2015-09

Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes

Lee, MY; Lee, YS; Lee, Hee Chulresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255, 2005

Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chulresearcher, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05

Fermi Level Depinning in Ti/GeO2/n-Ge via the Interfacial Reaction Between Ti and GeO2

Seo, Yujin; Lee, Tae In; Ahn, Hyunjun; Moon, Jungmin; Hwang, Wan Sik; Yu, Hyun-Yong; Cho, Byung Jinresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.10, pp.4242 - 4245, 2017-10

Graphene Oxide Thin Films for Flexible Nonvolatile Memory Applications

Jeong, Hu-Young; Kim, Jong-Yun; Kim, Jeong-Won; Hwang, Jin-Ok; Kim, Ji-Eun; Lee, Jeong-Yongresearcher; Yoon, Tae-Hyun; et al, NANO LETTERS, v.10, no.11, pp.4381 - 4386, 2010-11



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