Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Hafnium Zirconium Oxide (HZO)▼aRemanent Polarization▼aEndurance▼aMFM capacitors▼aHigh Pressure Annealing (HPA)▼aRapid Thermal Annealing (RTA)▼aPulse Switching▼aImpedance analysis
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| Influence of high pressure annealing conditions on ferroelectric and interfacial properties of Zr rich MFM capacitors = Zr 함량에 따른 MFM 캐패시터의 강유전성 및 계면 특성에 대한 고압 열처리의 영향link Buyantogtokh, Batzorig; Jeon, Sanghun; et al, 한국과학기술원, 2021 |
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