Browse "School of Electrical Engineering(전기및전자공학부)" by Subject DAMAGE
Showing results 1 to 12 of 12
A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08 |
| Characterization and removal of silicon surface residue resulting from CHF3/C2F6 reactive ion etching Park, Sin Chong, JOURNAL OF APPLIED PHYSICS, v.76, no.8, pp.4596 - 4602, 1994-01 |
| Continuous, noninvasive wireless monitoring of flow of cerebrospinal fluid through shunts in patients with hydrocephalus Krishnan, Siddharth R.; Arafa, Hany M.; Kwon, Kyeongha; Deng, Yujun; Su, Chun-Ju; Reeder, Jonathan T.; Freudman, Juliet; et al, NPJ DIGITAL MEDICINE, v.3, no.1, 2020-03 |
| EFFECTS OF ELECTRON-BEAM DAMAGE ON THE ELECTRICAL CHARACTERISTICS OF N-TYPE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTORS Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.3A, pp.1223 - 1227, 1994 |
| Improved Self-Curing Effect in a MOSFET with Gate Biasing Lee, Geon-Beom; Jung, Jin-Woo; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp.1731 - 1734, 2021-12 |
| Miniaturized, light-adaptive, wireless dosimeters autonomously monitor exposure to electromagnetic radiation Kwon, Kyeongha; Heo, Seung Yun; Yoo, Injae; Banks, Anthony; Chan, Michelle; Lee, Jong Yoon; Park, Jun Bin; et al, SCIENCE ADVANCES, v.5, no.12, 2019-12 |
| Overestimation of Oxide Defects Density in Large Test Capacitors Due to Plasma Processing Shin, Hyung-Cheol; Je, Minkyu; Hu, Chenming, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.44, no.9, pp.1554 - 1556, 1997-09 |
| Performance comparison of wet-etched and dry-etched Geiger-mode avalanche photodiodes using a single diffusion process Lee, Ki Won; Yang, Kyounghoon, PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, v.10, no.11, pp.1445 - 1447, 2013-11 |
| Quantitative mapping of diffusion characteristics under the cortical surface Koo, BB; Choi, K; Ronen, I; Lee, JM; Kim, Dae-Shik, MAGNETIC RESONANCE IMAGING, v.28, no.SI, pp.1175 - 1182, 2010-10 |
| Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
| Ultrasonic wireless sensor development for online fatigue crack detection and failure warning Yang, Suyoung; Jung, Jinhwan; Liu, Peipei; Lim, Hyung Jin; Yi, Yung; Sohn, Hoon; Bae, In-Hwan, STRUCTURAL ENGINEERING AND MECHANICS, v.69, no.4, pp.407 - 416, 2019-02 |
| Wireless, Accumulation Mode Dosimeters for Monitoring Pulsed and Non-Pulsed Germicidal Lamps Heo, Seung Yun; Kwon, Kyeongha; Chan, Michelle; Gutruf, Philipp; Burton, Alex; Banks, Tony; Duan, Chongwen; et al, IEEE SENSORS JOURNAL, v.21, no.17, pp.18706 - 18714, 2021-07 |
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