Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Current atomic force microscopy
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| Resistive switching characteristics of a modified active electrode and Ti buffer layer in Cu-Se-based atomic switch Woo, Hyunsuk; Vishwanath, Sujaya Kumar; Jeon, Sanghun, JOURNAL OF ALLOYS AND COMPOUNDS, v.753, pp.551 - 557, 2018-07 |
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