Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Back-bias
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| Ultra-fast Data Sanitization of SRAM by Back-biasing to Resist a Cold Boot Attack Han, Seong-Joo; Han, Joon-Kyu; Yun, Gyeong-Jun; Lee, Mun-Woo; Yu, Ji-Man; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-01 |
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