Browse "School of Electrical Engineering(전기및전자공학부)" by Author Paek, Seung-Wook

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Timing error masking by exploiting operand value locality in SIMD architecture

Sim, Jaehyeong; Park, Jun-Seok; Paek, Seung-Wook; Kim, Lee-Sup, 32nd IEEE International Conference on Computer Design, ICCD 2014, pp.90 - 96, IEEE Circuits and Systems Society, 2014-10

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