Browse "School of Electrical Engineering(전기및전자공학부)" by Author Byun, Junyoung
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| Understanding Vqa For Negative Answers Through Visual And Linguistic Inference Jung, Seungjun; Byun, Junyoung; Shim, Kyujin; Hwang, Sanghyun; Kim, Changick, IEEE International Conference on Image Processing (ICIP), pp.2873 - 2877, IEEE, 2021-09-19 |
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