Browse "School of Electrical Engineering(전기및전자공학부)" by Author Y.H.Koh

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Experimental Analysis and Suppression Method of CMOS Latchup Phenomena

Y.H.Koh; C.K.Kim; C.M.Kyung, 전기학회논문지, v.22, no.5, pp.469 - 475, 1985-09

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