Browse "School of Electrical Engineering(전기및전자공학부)" byAuthorXu, MZ

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1
Role of hole fluence in gate oxide breakdown

Li, MF; He, YD; Ma, SG; Cho, Byung Jinresearcher; Lo, KF; Xu, MZ, IEEE ELECTRON DEVICE LETTERS, v.20, no.11, pp.586 - 588, 1999-11

2
Roles of primary hothole and FN electron fluences in gate oxide breakdown

Cho, Byung Jinresearcher; Li, MF; He, YD; Ma, SG; Lo, KF; Xu, MZ, Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc, pp.0 - 0, 1999-11-29

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