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A NEW EXPERIMENTAL-METHOD (E-PLOT) TO CHARACTERIZE THE SUBSTRATE-CURRENT AND THE SATURATION-VOLTAGE OF FRESH AND HOT-ELECTRON-DAMAGED NMOSFETS KIM, SH; MIN, KS; Lee, Kwyro, SOLID-STATE ELECTRONICS, v.37, no.1, pp.198 - 200, 1994-01 |
TEMPERATURE-DEPENDENT HOLE AND ELECTRON-MOBILITY MODELS FOR CMOS CIRCUIT SIMULATION MIN, KS; Lee, Kwyro, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.42, no.11, pp.1956 - 1961, 1995-11 |
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