Browse "School of Electrical Engineering(전기및전자공학부)" by Author H.C.Oh
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| Comparison of Numerical Methods for Obtaining 2-D Impurity Profile in Semiconductor Y.Y.Yang; C.M.Kyung; H.C.Oh, 전기학회논문지, v.22, no.3, pp.95 - 102, 1985-05 |
| Numerical Evaluation of Impurity Profile in Silicon H.C.Oh; Kyung, Chong-Min, 전기학회논문지, v.21, no.6, pp.17 - 26, 1984-11 |
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