Browse "School of Electrical Engineering(전기및전자공학부)" by Author Gu, X.
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| A through-silicon-via to active device noise coupling study for CMOS SOI technology Duan, X.; Gu, X.; Cho, J.; Kim, Joungho, 2011 61st Electronic Components and Technology Conference, ECTC 2011, pp.1791 - 1795, ECTC 2011, 2011-05-31 |
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