Browse "School of Electrical Engineering(전기및전자공학부)" byAuthorEnzo Di Fabrizio

Showing results 1 to 1 of 1

1
The Effect of x-Ray Irradiation-Induced Damage on Reliability in MOS Structures

Shi-Ho Kim; Ho-Jun Lee; Chul-Hi Han; Lee, Kwyroresearcher; Sang-Soo Choi; Young-Jin Jeon; Enzo Di Fabrizio; et al, SOLID STATE ELECTRONICS, 1994-09

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0