Browse "School of Electrical Engineering(전기및전자공학부)" by Author Doan, J.C.
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| Effects of dielectric materials on electromigration failure Doan, J.C.; Lee, S.; Lee, Seok-Hee; Flinn, P.A.; Bravman, J.C.; Marieb, T.N., JOURNAL OF APPLIED PHYSICS, v.89, no.12, pp.7797 - 7808, 2001-06 |
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