Browse "School of Electrical Engineering(전기및전자공학부)" by Author Chung, Yong-Chae
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| Multi-scale Simulation of Interfacial Roughness Effects in Silicon Nanowires Kim, Byung-Hyun; Jung, Hyo-Eun; Chung, Yong-Chae; Shin, Mincheol; Lee, Kwnag-Ryeol, 2012 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2012, pp.47 - 50, Institute of Electrical and Electronics Engineers Inc., 2012-09-06 |
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