Browse "School of Electrical Engineering(전기및전자공학부)" by Author Chung, U-In
Showing results 1 to 16 of 16
| A Simple Device Unit Consisting of All NiO Storage and Switch Elements for Multilevel Terabit Nonvolatile Random Access Memory Lee, Myoung-Jae; Ahn, Seung-Eon; Lee, Chang Bum; Kim, Chang-Jung; Jeon, Sanghun; Chung, U-In; Yoo, In-Kyeong; et al, ACS APPLIED MATERIALS & INTERFACES, v.3, no.11, pp.4475 - 4479, 2011-11 |
| Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays Jeon, Sanghun; Ahn, Seung-Eon; Song, Ihun; Kim, Chang Jung; Chung, U-In; Lee, Eunha; Yoo, Inkyung; et al, NATURE MATERIALS, v.11, no.4, pp.301 - 305, 2012-04 |
| High-Performance Nanowire Oxide Photo-Thin Film Transistors Ahn, Seung-Eon; Jeon, Sanghun; Jeon, Youg Woo; Kim, Changjung; Lee, Myoung-Jae; Lee, Chang-Won; Park, Jongbong; et al, ADVANCED MATERIALS, v.25, no.39, pp.5549 - 5554, 2013-10 |
| Highly Stretchable Resistive Pressure Sensors Using a Conductive Elastomeric Composite on a Micropyramid Array Choong, Chwee-Lin; Shim, Mun-Bo; Lee, Byoung-Sun; Jeon, Sanghun; Ko, Dong-Su; Kang, Tae-Hyung; Bae, Jihyun; et al, ADVANCED MATERIALS, v.26, no.21, pp.3451 - 3458, 2014-06 |
| Impact of transparent electrode on photoresponse of ZnO-based phototransistor Lee, Seunghyup; Ahn, Seung-Eon; Jeon, Yongwoo; Ahn, Ji-Hoon; Song, Ihun; Jeon, Sanghun; Yun, Dong-Jin; et al, APPLIED PHYSICS LETTERS, v.103, no.25, 2013-12 |
| Influence of Hf contents on interface state properties in a-HfInZnO thin-film transistors with SiNx/SiOx gate dielectrics Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.99, no.18, 2011-10 |
| Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09 |
| Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays Ahn, Seung-Eon; Song, Ihun; Jeon, Sanghun; Jeon, Youg Woo; Kim, Young; Kim, Changjung; Ryu, Byungki; et al, ADVANCED MATERIALS, v.24, no.19, pp.2631 - 2636, 2012-05 |
| Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications Jeon, Sanghun; Park, Sungho; Song, Ihun; Hur, Ji-Hyun; Park, Jaechul; Kim, Hojung; Kim, Sunil; et al, ACS APPLIED MATERIALS & INTERFACES, v.3, no.1, pp.1 - 6, 2011-01 |
| Origin of High Photoconductive Gain in Fully Transparent Heterojunction Nanocrystalline Oxide Image Sensors and Interconnects Jeon, Sanghun; Song, Ihun; Lee, Sungsik; Ryu, Byungki; Ahn, Seung-Eon; Lee, Eunha; Kim, Young; et al, ADVANCED MATERIALS, v.26, no.41, pp.7102 - +, 2014-11 |
| Persistent photoconductivity in Hf-In-Zn-O thin film transistors Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10 |
| Short channel device performance of amorphous InGaZnO thin film transistor Jeon, Sanghun; Benayad, Anass; Ahn, Seung-Eon; Park, Sungho; Song, Ihun; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.99, no.8, 2011-08 |
| The impact of active layer thickness on low-frequency noise characteristics in InZnO thin-film transistors with high mobility Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, APPLIED PHYSICS LETTERS, v.100, no.17, 2012-04 |
| Three-Dimensional Integration Approach to High-Density Memory Devices Kim, Hojung; Jeon, Sanghun; Lee, Myoung-Jae; Park, Jaechul; Kang, Sangbeom; Choi, Hyun-Sik; Park, Churoo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.11, pp.3820 - 3828, 2011-11 |
| Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors Lee, Sungsik; Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Jeon, Sanghun; Kim, Changjung; Song, I-Hun; et al, APPLIED PHYSICS LETTERS, v.98, no.20, 2011-05 |
| Verification of Interface State Properties of a-InGaZnO Thin-Film Transistors With Sin(x) and SiO2 Gate Dielectrics by Low-Frequency Noise Measurements Choi, Hyun-Sik; Jeon, Sanghun; Kim, Hojung; Shin, Jaikwang; Kim, Changjung; Chung, U-In, IEEE ELECTRON DEVICE LETTERS, v.32, no.8, pp.1083 - 1085, 2011-08 |
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