Browse "School of Electrical Engineering(전기및전자공학부)" by Author CIRILLO, NC
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| FET CHARACTERIZATION USING GATED-TLM STRUCTURE BAIER, SM; SHUR, MS; Lee, Kwyro; CIRILLO, NC; HANKA, SA, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.32, no.12, pp.2824 - 2829, 1985-12 |
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