Browse "School of Electrical Engineering(전기및전자공학부)" byAuthorByun, Kyeonjin

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A Fault Tolerant Cache of Automotive Vision Processor Complying with ISO26262

Yoo, Hoi Junresearcher; Han, Jin Ho; Kwon, Youngsu; Byun, Kyeonjin, IEEE International Symposium on Circuit and Systems, IEEE, 2016-05

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