Browse "School of Electrical Engineering(전기및전자공학부)" by Author AMBERIADIS, K
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| CARRIER DISTRIBUTION AND LOW-FIELD RESISTANCE IN SHORT N+-N--N+ AND N+-P--N+ STRUCTURES VANDERZIEL, A; SHUR, MS; Lee, Kwyro; CHEN, TH; AMBERIADIS, K, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.30, no.2, pp.128 - 137, 1983-02 |
| EFFECT OF TRAP DISTRIBUTION ON G-R NOISE SPECTRA Lee, Kwyro; AMBERIADIS, K; VANDERZIEL, A, SOLID-STATE ELECTRONICS, v.25, no.10, pp.999 - 1002, 1982 |
| LOW-FREQUENCY NOISE DUE TO CARRIER RECOMBINATION IN A P-N-JUNCTION Lee, Kwyro; AMBERIADIS, K, SOLID-STATE ELECTRONICS, v.25, no.10, pp.995 - 998, 1982 |
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