Browse "School of Electrical Engineering(전기및전자공학부)" by Author 506
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| Formation of stacking faults and misfit dislocations during Zn diffusion-enhanced intermixing of a GaInAsP/InP heterostructure Park, HyoHoon; Nam, ES; Lee, YT; Lee, EH; Lee, JeongYong; Kwon, OD, MRS Symposium 1990, pp.591 - 591, 1990-12-01 |
| Oxidation and Initial Growth Stage of Microcrystalline Si Film Deposited by Photo-CVD and Its Memory Device Application Lee, Jeong Yong; Lim, Koeng Su, Materials Research Society, 2000-11-01 |
| Strain relaxation via interface nucleation of misfit dislocations in intermixing layers Park, HyoHoon; Lee, JK; Lee, EH; Lee, JeongYong; Hong, SK, MRS Symposium 1992, pp.479 - 487, MRS, 1992-05-01 |
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