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Browse "School of Electrical Engineering(전기및전자공학부)" by Author Kim, Sangwook

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Showing results 1 to 7 of 7

1	A sampling-based 128x128 direct photon-counting X-ray image sensor with 3 energy bins and spatial resolution of 60um/pixel Kim, Hyun Sik; Han, Sang Wook; Yang, Jun Hyeok; Kim, Sunil; Kim, Young; Kim, Sangwook; Yoon, Dae Kun; et al, 2012 IEEE International Solid- State Circuits Conference - (ISSCC), IEEE, 2012-02
2	A sampling-based 128x128 direct photon-counting X-ray image sensor with 3 energy bins and spatial resolution of 60μm/pixel Kim, Hyun-Sik; Han, Sang-Wook; Yang, Jun-Hyeok; Kim, Sunil; Kim, Young; Kim, Sangwook; Yoon, Dae-Kun; et al, 2012 IEEE International Solid-State Circuits Conference, ISSCC 2012, pp.110 - 112, IEEE, 2012-02-19
3	Instability in threshold voltage and subthreshold behavior in Hf-In-Zn-O thin film transistors induced by bias-and light-stress Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.11, 2010-09
4	Low-Frequency Noise Performance of a Bilayer InZnO-InGaZnO Thin-Film Transistor for Analog Device Applications Jeon, Sanghun; Kim, Sun Il; Park, Sungho; Song, Ihun; Park, Jaechul; Kim, Sangwook; Kim, Changjung, IEEE ELECTRON DEVICE LETTERS, v.31, no.10, pp.1128 - 1130, 2010-10
5	Nanometer-Scale Oxide Thin Film Transistor with Potential for High-Density Image Sensor Applications Jeon, Sanghun; Park, Sungho; Song, Ihun; Hur, Ji-Hyun; Park, Jaechul; Kim, Hojung; Kim, Sunil; et al, ACS APPLIED MATERIALS & INTERFACES, v.3, no.1, pp.1 - 6, 2011-01
6	Persistent photoconductivity in Hf-In-Zn-O thin film transistors Ghaffarzadeh, Khashayar; Nathan, Arokia; Robertson, John; Kim, Sangwook; Jeon, Sanghun; Kim, Changjung; Chung, U-In; et al, APPLIED PHYSICS LETTERS, v.97, no.14, 2010-10
7	The influence of visible light on the gate bias instability of In-Ga-Zn-O thin film transistors Kim, Sangwook; Kim, Sunil; Kim, Changjung; Park, JaeChul; Song, Ihun; Jeon, Sanghun; Ahn, Seung-Eon; et al, SOLID-STATE ELECTRONICS, v.62, no.1, pp.77 - 81, 2011-08

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