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Design of a Smart CMOS Readout Circuit for Panoramic X-Ray Time Delay and Integration Arrays Kim, Chul Bum; Woo, Doo Hyung; Kim, Byung Hyuk; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.7, pp.1212 - 1219, 2011-07 |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.39, no.7B, pp.757 - 759, 2000-07 |
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