Showing results 2 to 4 of 4
Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.35, no.3, pp.495 - 503, 2022-08 |
Synthesis of Lithography Test Patterns Using Machine Learning Model Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.1, pp.49 - 57, 2021-02 |
TSUNAMI: Triple Sparsity-Aware Ultra Energy-Efficient Neural Network Training Accelerator With Multi-Modal Iterative Pruning Kim, Sangyeob; Lee, Juhyoung; Kang, Sanghoon; Han, Donghyeon; Jo, Wooyoung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.69, no.4, pp.1494 - 1506, 2022-04 |
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