Browse "School of Electrical Engineering(전기및전자공학부)" by Subject dynamic negative-bias temperature instability (DNBTI)
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| A comprehensive modeling of dynamic negative-bias temperature instability in PMOS body-tied FinFETs Lee, H; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.4, pp.281 - 283, 2006-04 |
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