Browse "School of Electrical Engineering(전기및전자공학부)" by Subject 2-D simulation
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| Electrical-Stress-Induced Threshold Voltage Instability in Solution-Processed ZnO Thin-Film Transistors: An Experimental and Simulation Study Gupta, Dipti; Yoo, Seunghyup; Lee, Changhee; Hong, Yongtaek, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.7, pp.1995 - 2002, 2011-07 |
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