Browse "School of Electrical Engineering(전기및전자공학부)" by Subject (110) wafer

Showing results 1 to 1 of 1

1
Atomic force microscope probe tips using heavily boron-doped silicon cantilevers realized in a (110) bulk silicon wafer

Cho, Il-Joo; Park, Eun-Chul; Hong, Songcheol; Yoon, Euisik, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7103 - 7107, 2000-12

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0