Browse "School of Electrical Engineering(전기및전자공학부)" by Title
Showing results 19321 to 19340 of 51409
| Gas-phase etching of TEOS and PSG sacrifice layers using anhydrous HF and CH3OH Chung, HH; Jang, WI; Lee, CS; Lee, JH; Yoo, Hyung Joun, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.30, no.3, pp.628 - 631, 1997-06 |
| GaSb/InAs Heterojunction-based UTB Tunnel FETs: A first principles study 조유철; 신민철; 장윤희, 제 26회 한국반도체학술대회, 제 26회 한국반도체학술대회, 2019-02-15 |
| Gate and functional level logic simulation with 8-state signal model = 8-상태의 신호 모델을 이용한 게이트 및 기능 레벨의 논리 시뮬레이션link Kweon, Tai-Wook; 권태욱; et al, 한국과학기술원, 1983 |
| Gate Bias Dependence of Substrate Signal Coupling Effect in RF MOSFETs Je, Minkyu; Shin, Hyung-Cheol, IEEE ELECTRON DEVICE LETTERS, v.24, no.3, pp.183 - 185, 2003-03 |
| Gate Controlled Diode를 이용한 HgCdTe의 표면재결합속도 측정 이희철; 최종화, 제6회 한국반도체 학술대회, pp.183 - 184, 1999 |
| Gate Controlled Diode를 이용한 HgCeTe Photodiode의 특성평가 Lee, Hee-Chul; Choi, Jong-Hwa, 새물리, v.41, no.4, pp.235 - 238, 2000-10 |
| Gate Delay Modeling for Static Timing Analysis of Body-Biased Circuits Baek, Donkyu; Ship, Insup; Shin, Youngsoo, IEEE International Conference on Integrated Circuit Design and Technology (ICICDT), IEEE, 2012-05-31 |
| Gate driving method for synchronous rectifiers in phase-shifted full-bridge converter Baek, Jae-Il; Kim, Chong-Eun; Lee, Jae-Bum; Youn, Han-Shin; Moon, Gun-Woo, Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, pp.753 - 758, IEEE, 2015-06-02 |
| Gate leakage current in double-gate MOSFETs with Si/SiO2 interface model from first principle calculations Park, Y.; Kong, K.-J.; Chang, H.; Shin, Mincheol, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp.1109 - 1112, IEEE, 2010-08-17 |
| Gate oxide damage from high dose implantation of hydrogen Choi, Yang-Kyu; Yun, C; Park, D; Cheung, N, the 13th International Conference on Ion Implantation Technology, 2000-09 |
| Gate oxide reliability concern associated with X-ray lithography Cho, Byung Jin; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, Extended Abstract of the 200 International Conf. on Solid State Devices and Materials (SSDM), pp.0 - 0, 2000-08-28 |
| Gate- versus defect-induced voltage drop and negative differential resistance in vertical graphene heterostructures Kim, Tae Hyung; Lee, Juho; Lee, Ryong-Gyu; Kim, Yong-Hoon, NPJ COMPUTATIONAL MATERIALS, v.8, no.1, 2022-03 |
| Gate-All-Around Silicon Nanowire MOSFETs on Bulk Substrate Choi, Yang-Kyu; Han, Jin-Woo; Ryu, Seong-Wan; Kim, Sungho; Kim, Chung-Jin; Ahn, Jae-Hyuk; Choi, Sung-Jin; et al, The 16th Korean Conference on Semiconductors, pp.648 - 649, 2009-02 |
| Gate-controlled Active Graphene Metamaterials Lee, Seung Hoon; Choi, Muhan; Kim, Teun-Teun; Lee, Seungwoo; Liu, Ming; Yin, Xiaobo; Choi, Hong Kyw; et al, Quantum Electronics and Laser Science Conference, Quantum Electronics and Laser Science Conference, 2012-05-06 |
| Gate-controlled active graphene metamaterials at terahertz frequencies Lee, Seung Hoon; Choi, Muhan; Kim, Teun-Teun; Lee, Seungwoo; Liu, Ming; Yin, Xiaobo; Choi, Hong Kyw; et al, OECC 2012, Opto-Electronics and Communications Conference (OECC), 2012-07-02 |
| Gate-controlled diode를 이용한 HgCdTe photodiode의 특성평가 이희철; 최종화, 제10회 적외선 영상센서 Conference, 1999 |
| Gate-Induced Drain-Leakage (GIDL) Programming Method for Soft-Programming-Free Operation in Unified RAM (URAM) Han, Jin-Woo; Ryu, Seong-Wan; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.2, pp.189 - 191, 2009-02 |
| Gate-to-Source/Drain Non-Overlap Device for Soft-Program Immune Unified-RAM (URAM) Han, Jin-Woo; Kim, Chung-Jin; Choi, Sung-Jin; Kim, Dong-Hyun; Moon, Dong-Il; Choi, Yang-Kyu, IEEE Electron Device Letters, Vol. 30, No. 5, pp.544-546, 2009-05 |
| Gate-to-Source/Drain Nonoverlap Device for Soft-Program Immune Unified RAM (URAM) Han, Jin-Woo; Kim, Chung-Jin; Choi, Sung-Jin; Kim, Dong-Hyun; Moon, Dong-Il; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.5, pp.544 - 546, 2009-05 |
| Gate-Tunable Resonant Tunneling in Double Bilayer Graphene Heterostructures Fallahazad, Babak; Lee, Kayoung; Kang, Sangwoo; Xue, Jiamin; Larentis, Stefano; Corbet, Christopher; Kim, Kyounghwan; et al, NANO LETTERS, v.15, no.1, pp.428 - 433, 2015-01 |
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