Sideband spectroscopy and dispersion measurement in microcavities

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The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible. The method is applicable for high-Q, micro-cavities having microwave rate free spectral range and has a relative precision of 5.5 x 10(-6) for a 2 mm disk cavity with FSR of 32.9382 GHz and Q of 150 milllion. (C) 2012 Optical Society of America
Publisher
OPTICAL SOC AMER
Issue Date
2012-11
Language
English
Article Type
Article
Keywords

WHISPERING-GALLERY MODES; OPTICAL MICROCAVITIES; FREQUENCY COMBS; LASER; MICRORESONATOR; RESONATORS; SILICON; NOISE; CHIP

Citation

OPTICS EXPRESS, v.20, no.24, pp.26337 - 26350

ISSN
1094-4087
DOI
10.1364/OE.20.026337
URI
http://hdl.handle.net/10203/198981
Appears in Collection
NT-Journal Papers(저널논문)
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