A 148fS(rms) Integrated Noise 4 MHz Bandwidth Second-Order Delta Sigma Time-to-Digital Converter With Gated Switched-Ring Oscillator

Abstract

This paper presents a second-order Delta Sigma time-to-digital converter (TDC) by using a switched-ring oscillator (SRO) and a gated switched-ring oscillator (GSRO). Unlike conventional multi-stage noise-shaping (MASH) TDC using SROs, the proposed TDC does not require complex calibration to compensate for the error from frequency difference between the oscillators. Furthermore, the performance of the proposed TDC is analyzed, including non-idealities such as phase noise, mismatch, and PVT variations. The prototype 1-1 MASH TDC achieves 148fS(rms) integrated noise in 4 MHz signal bandwidth at 400 MS/s while consuming 6.55 mW in a 65 nm CMOS process.