DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song I. | - |
dc.contributor.author | Yoo H. | - |
dc.contributor.author | Choo J. | - |
dc.contributor.author | Gweon, Dae-Gab | - |
dc.date.accessioned | 2010-09-03 | - |
dc.date.available | 2010-09-03 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2005-08-02 | - |
dc.identifier.citation | Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, v.5878, no., pp.1 - 9 | - |
dc.identifier.uri | http://hdl.handle.net/10203/19161 | - |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.title | Measurement of point-spread function (PSF) for confocal fluorescence microscopy | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-29244443456 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 5878 | - |
dc.citation.beginningpage | 1 | - |
dc.citation.endingpage | 9 | - |
dc.citation.publicationname | Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Song I. | - |
dc.contributor.nonIdAuthor | Yoo H. | - |
dc.contributor.nonIdAuthor | Choo J. | - |
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