NMR Spectroscopy for Thin Films by Magnetic Resonance Force Microscopy

Cited 2 time in webofscience Cited 0 time in scopus
  • Hit : 408
  • Download : 509
Nuclear magnetic resonance (NMR) is a fundamental research tool that is widely used in many fields. Despite its powerful applications, unfortunately the low sensitivity of conventional NMR makes it difficult to study thin film or nano-sized samples. In this work, we report the first NMR spectrum obtained from general thin films by using magnetic resonance force microscopy (MRFM). To minimize the amount of imaging information inevitably mixed into the signal when a gradient field is used, we adopted a large magnet with a flat end with a diameter of 336 mm that generates a homogeneous field on the sample plane and a field gradient in a direction perpendicular to the plane. Cyclic adiabatic inversion was used in conjunction with periodic phase inversion of the frequency shift to maximize the SNR. In this way, we obtained the F-19 NMR spectrum for a 34 nm-thick CaF2 thin film.
Publisher
NATURE PUBLISHING GROUP
Issue Date
2013-11
Language
English
Article Type
Article
Keywords

LINE SHAPES; CANTILEVERS

Citation

SCIENTIFIC REPORTS, v.3, pp.3189

ISSN
2045-2322
DOI
10.1038/srep03189
URI
http://hdl.handle.net/10203/188609
Appears in Collection
PH-Journal Papers(저널논문)
Files in This Item
000327019200001.pdf(590.32 kB)Download
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 2 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0