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Safe memory read-path using silent CRC calculation of binary bit-inversion for low-power fast ROM integrity verifcation

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Park, Daejin / Kim, Tag-Gonresearcher
Publisher
IEEE
Issue Date
2013-09-10
Language
English
Citation

The 3rd IEEE International Conference on Consumer Electronics

URI
http://hdl.handle.net/10203/187878
Appears in Collection
EE-Conference Papers(학술회의논문)
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