Scanning Thermoelectric Microscopywith Atomic Resolution: SeebeckEffect at the Atomic Scale

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dc.contributor.authorKim, Yong-Hyun-
dc.contributor.authorLee, Eui Sup-
dc.contributor.authorCho, Sanghee-
dc.contributor.authorKang, Stephen Dongmin-
dc.contributor.authorKim, Wondong-
dc.contributor.authorWoo,Sung-Jae-
dc.contributor.authorKong, Ki-Jeong-
dc.contributor.authorKim, Ilyou-
dc.contributor.authorLyeo, Ho-Ki-
dc.contributor.authorKim, Hyeong-Do-
dc.contributor.authorZhang, Tong-
dc.contributor.authorStroscio, Joseph A.-
dc.date.accessioned2014-08-28T01:10:40Z-
dc.date.available2014-08-28T01:10:40Z-
dc.date.created2014-03-19-
dc.date.issued2014-02-07-
dc.identifier.citation제 10회 표면나노과학 워크샵, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/187537-
dc.languageKOR-
dc.publisher원자제어 저차원 전자계 연구단-
dc.titleScanning Thermoelectric Microscopywith Atomic Resolution: SeebeckEffect at the Atomic Scale-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname제 10회 표면나노과학 워크샵-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorKim, Yong-Hyun-
dc.contributor.localauthorLee, Eui Sup-
dc.contributor.nonIdAuthorCho, Sanghee-
dc.contributor.nonIdAuthorKang, Stephen Dongmin-
dc.contributor.nonIdAuthorKim, Wondong-
dc.contributor.nonIdAuthorWoo,Sung-Jae-
dc.contributor.nonIdAuthorKong, Ki-Jeong-
dc.contributor.nonIdAuthorKim, Ilyou-
dc.contributor.nonIdAuthorLyeo, Ho-Ki-
dc.contributor.nonIdAuthorKim, Hyeong-Do-
dc.contributor.nonIdAuthorZhang, Tong-
dc.contributor.nonIdAuthorStroscio, Joseph A.-
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NT-Conference Papers(학술회의논문)
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