| 12165 | Quantification of The Skin barrier Function 안재환; 남윤성, 2022 한국바이오칩학회 춘계 학술대회, 한국바이오칩학회, 2022-05-19 |
| 12166 | Quantitative Analysis of Elasitic Properties of Al-Li Alloys Using Ultrasonic Velocity Measurement and TEM Park, Joong Keun; Jeon, SM; Kim, JD; Lee, SS, In Review of Progress in Quantitative Nondestructive Evaluation, v.12, pp.1625 - 1630, 1992 |
| 12167 | Quantitative Analysis of Elastic Properties of Al-Li-Cu Alloys Park, Joong Keun; Lee, BC; Lee, SS, 5th Int. Symp. on Nondestructive Characterization of Materials, 1993-06 |
| 12168 | Quantitative Analysis of Impedance Spectra for the Pits of Alloy 600 in Cl--Ion Containing Solution at Elevated Solution Temperatures and Pressures 변수일, The Korean Electrochemical Society, pp.25 - 25, 2002 |
| 12169 | Quantitative Analysis of Lithium Transport through Li1-dCoO2 Thin Film Electrode 변수일, The Korean Electrochemical Society, pp.42 - 42, 2000 |
| 12170 | Quantitative analysis of magnon characteristics with unidirectional magnetoresistance Lee, Nyun Jong; Jang, Heechan; Park, Eunkang; Lee, Ki-Seung; Jeong, Seyeop; Lee, Soogil; Park, Byong-Guk; et al, PHYSICAL REVIEW APPLIED, v.20, no.6, 2023-12 |
| 12171 | Quantitative analysis of repassivation kinetics of ferritic stainless steels based on the high field ion conduction model Cho, EunAe; Kim, Chin-Kwan; Kim, Joon-Shick; Kwon, Hyuk-Sang, ELECTROCHIMICA ACTA, v.45, no.12, pp.1933 - 1942, 2000-02 |
| 12172 | Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device No, Kwangsoo; Woo, J; Hong, S, IEEE international symposium on the applications of ferroelectrics (ISAF 2000), 2000-01-01 |
| 12173 | Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device 노광수; 우정원; 홍승범; 신현정; 전종업, 한국요업학회 춘계학술발표대회, 한국요업학회, 2000-01-01 |
| 12174 | Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory deviceQuantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy 노광수, ISAF, 2000 |
| 12175 | Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14 |
| 12176 | Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy Woo, J; Hong, Daniel Seungbum; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsoo, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001 |
| 12177 | Quantitative analysis of the lithium transport through the $Li_{1-δ}CoO_2$ film electrode prepared by RF magnetron sputtering = RF 마그네트론 스퍼터링법으로 제조된 $Li_{1-δ}CoO_2$ 박막 전극을 통한 리튬 이동의 정량적 해석link Go, Joo-Young; 고주영; et al, 한국과학기술원, 2001 |
| 12178 | Quantitative comparison of the influences of tungsten and molybdenum on the passivity of Fe-29Cr ferritic stainless steels Ahn, MK; Kwon, Hyuk-Sang; Lee, HyuckMo, CORROSION SCIENCE, v.40, no.2-3, pp.307 - 322, 1998-02 |
| 12179 | Quantitative evaluations of a high-voltage multiscan CCD camera Kim, YM; Lee, JeongYong; Moonen, D; Jang, KI; Kim, YJ, JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224, 2007-12 |
| 12180 | Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy Choi, Hyun-Woo; Hong, Daniel Seungbum; No, Kwang-Soo, REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.11, 2011-11 |
| 12181 | Quantitative Measurement of Li-Ion Concentration and Diffusivity in Solid-State Electrolyte Park, Gun; Kim, Hongjun; Oh, Jimin; Choi, Youngwoo; Ovchinnikova, Olga S.; Min, Seokhwan; Lee, Young-Gi; et al, ACS APPLIED ENERGY MATERIALS, v.4, no.1, pp.784 - 790, 2021-01 |
| 12182 | Quantitative measurements of absolute dielectrophoretic forces using optical tweezers Hong, Yoochan; Pyo, Jin-Woo; Baek, Sang Hyun; Lee, Sang Woo; Yoon, Dae Sung; No, Kwangsoo; Kim, Beop-Min, OPTICS LETTERS, v.35, no.14, pp.2493 - 2495, 2010-07 |
| 12183 | Quantitative morphometric measurements using site selective image cytometry of intact tissue Kwon, Hyuk-Sang; Nam, YoonSung; Wiktor-Brown, Dominika M.; Engelward, Bevin P.; So, Peter T. C., JOURNAL OF THE ROYAL SOCIETY INTERFACE, v.6, pp.45 - 57, 2009-02 |
| 12184 | Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05 |
