Browse "Dept. of Materials Science and Engineering(신소재공학과)" byTitle

Showing results 11194 to 11213 of 17688

11194
Quantitative Analysis of Elasitic Properties of Al-Li Alloys Using Ultrasonic Velocity Measurement and TEM

Park, Joong Keunresearcher; Jeon, SM; Kim, JD; Lee, SS, In Review of Progress in Quantitative Nondestructive Evaluation, v.12, pp.1625 - 1630, 1992

11195
Quantitative Analysis of Elastic Properties of Al-Li-Cu Alloys

Park, Joong Keunresearcher; Lee, BC; Lee, SS, 5th Int. Symp. on Nondestructive Characterization of Materials, 1993-06

11196
Quantitative Analysis of Impedance Spectra for the Pits of Alloy 600 in Cl--Ion Containing Solution at Elevated Solution Temperatures and Pressures

변수일, The Korean Electrochemical Society, pp.25 - 25, 2002

11197
Quantitative Analysis of Lithium Transport through Li1-dCoO2 Thin Film Electrode

변수일, The Korean Electrochemical Society, pp.42 - 42, 2000

11198
Quantitative analysis of repassivation kinetics of ferritic stainless steels based on the high field ion conduction model

Cho, EunAeresearcher; Kim, Chin-Kwan; Kim, Joon-Shick; Kwon, Hyuk-Sangresearcher, ELECTROCHIMICA ACTA, v.45, no.12, pp.1933 - 1942, 2000-02

11199
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device

No, Kwangsooresearcher; Woo, J; Hong, S, IEEE international symposium on the applications of ferroelectrics (ISAF 2000), 2000-01-01

11200
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory device

노광수researcher; 우정원; 홍승범; 신현정; 전종업, 한국요업학회 춘계학술발표대회, 한국요업학회, 2000-01-01

11201
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in atomic force microscope based memory deviceQuantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

노광수researcher, ISAF, 2000

11202
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, S; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsooresearcher, 13th International Vaccum Microelectronics Conference, v.19, no.3, pp.818 - 824, 2000-08-14

11203
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy

Woo, J; Hong, Daniel Seungbumresearcher; Setter, N; Shin, H; Jeon, JU; Pak, YE; No, Kwangsooresearcher, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.19, no.3, pp.818 - 824, 2001

11204
Quantitative analysis of the lithium transport through the $Li_{1-δ}CoO_2$ film electrode prepared by RF magnetron sputtering = RF 마그네트론 스퍼터링법으로 제조된 $Li_{1-δ}CoO_2$ 박막 전극을 통한 리튬 이동의 정량적 해석link

Go, Joo-Young; 고주영; et al, 한국과학기술원, 2001

11205
Quantitative comparison of the influences of tungsten and molybdenum on the passivity of Fe-29Cr ferritic stainless steels

Ahn, MK; Kwon, Hyuk-Sangresearcher; Lee, HyuckMoresearcher, CORROSION SCIENCE, v.40, no.2-3, pp.307 - 322, 1998-02

11206
Quantitative evaluations of a high-voltage multiscan CCD camera

Kim, YM; Lee, JeongYongresearcher; Moonen, D; Jang, KI; Kim, YJ, JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224, 2007-12

11207
Quantitative measurement of in-plane cantilever torsion for calibrating lateral piezoresponse force microscopy

Choi, Hyun-Woo; Hong, Daniel Seungbumresearcher; No, Kwang-Sooresearcher, REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.11, 2011-11

11208
Quantitative Measurement of Li-Ion Concentration and Diffusivity in Solid-State Electrolyte

Park, Gun; Kim, Hongjun; Oh, Jimin; Choi, Youngwoo; Ovchinnikova, Olga S.; Min, Seokhwan; Lee, Young-Gi; et al, ACS APPLIED ENERGY MATERIALS, v.4, no.1, pp.784 - 790, 2021-01

11209
Quantitative measurements of absolute dielectrophoretic forces using optical tweezers

Hong, Yoochan; Pyo, Jin-Woo; Baek, Sang Hyun; Lee, Sang Woo; Yoon, Dae Sung; No, Kwangsooresearcher; Kim, Beop-Min, OPTICS LETTERS, v.35, no.14, pp.2493 - 2495, 2010-07

11210
Quantitative morphometric measurements using site selective image cytometry of intact tissue

Kwon, Hyuk-Sang; Nam, YoonSungresearcher; Wiktor-Brown, Dominika M.; Engelward, Bevin P.; So, Peter T. C., JOURNAL OF THE ROYAL SOCIETY INTERFACE, v.6, pp.45 - 57, 2009-02

11211
Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy

Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05

11212
Quantitative optical analysis for gold nanoparticle array formulated by evaporation induced self-assembly

김리향; 신종화researcher, 한국광학회 2017 하계학술발표대회, 한국광학회, 2017-07-12

11213
Quantitative study on the enhancement of sidewall coverage of sputter-deposited film by partially tapering the sidewall of via holes

Kim, Chang-Gyu; Lee, Won-Jongresearcher, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.29, no.2, pp.020604-1 - 020604-6, 2011-03

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