Browse "Dept. of Materials Science and Engineering(신소재공학과)" byAuthorWang, Lingquan

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A Distributed Model for Border Traps in Al2O3 - InGaAs MOS Devices

Yuan, Yu; Wang, Lingquan; Yu, Bo; Shin, Byungharesearcher; Ahn, Jaesoo; McIntyre, Paul C.; Asbeck, Peter M.; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.485 - 487, 2011-04

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