Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Author Park, Hongsik

Showing results 1 to 12 of 12

1
Analysis and modeling of resistive probes

Kim, Sang Wan; Hong, Daniel Seungbum; Choi, Woo Young; Song, Jae Young; Kim, Jong Pil; Kim, Junsoo; Ko, Hyoungsoo; et al, 2006 IEEE Nanotechnology Materials and Devices Conference, IEEE Nanotechnology Council, 2006-10

2
Building energy performance evaluation of building integrated photovoltaic (BIPV) window with semi-transparent solar cells

Chae, Young Tae; Kim, Jeehwan; Park, Hongsik; Shin, Byungha, APPLIED ENERGY, v.129, pp.217 - 227, 2014-09

3
Characterization of sensitivity and resolution of silicon resistive probe

Kim, Junsoo; Lee, Jaehong; Song, Ickhyun; Lee, Jong Duk; Park, Byung-Gook; Hong, Seungbum; Ko, Hyoungsoo; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.3, pp.1717 - 1722, 2008-03

4
Factors Determining the Resistive Switching Behavior of Transparent InGaZnO-Based Memristors

Qin, Fei; Zhang, Yuxuan; Park, Honghwi; Kim, Chung Soo; Lee, Dong Hun; Jiang, Zhong-Tao; Park, Jeongmin; et al, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.16, no.7, 2022-07

5
Formation and process optimization of scanning resistive probe

Shin, Hyunjung; Kim, Chanhyung; Lee, Bongki; Kim, Jiyoung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; et al, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.24, no.5, pp.2417 - 2420, 2006-09

6
Geometry- and size-dependence of electrical properties of metal contacts on semiconducting nanowires

Park, Hongsik; Beresford, Roderic; Hong, Seungbum; Xu, Jimmy, JOURNAL OF APPLIED PHYSICS, v.108, no.9, 2010-11

7
Grain/domain interaction antd its effect on bit formation in ferroelectric films

Kim, Yunseok; Hong, Daniel Seungbum; Park, Hongsik; Kim, Seung-Hyun; Min, Dong-Ki; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.78, pp.255 - 260, 2006

8
High-Resolution Field Effect Sensing of Ferroelectric Charges

Ko, Hyoungsoo; Ryu, Kyunghee; Park, Hongsik; Park, Chulmin; Jeon, Daeyoung; Kim, Yong Kwan; Jung, Juhwan; et al, NANO LETTERS, v.11, no.4, pp.1428 - 1433, 2011-04

9
Investigation of resistive probes with high sensitivity

Kim, Sang Wan; Hong, Daniel Seungbum; Song, Jae Young; Kim, Jong Pil; Choi, Woo Young; Chung, Han Ki; Park, Jae Hyun; et al, Silicon Nanoelectronics Workshop, 2008

10
Investigation of resistive probes with high sensitivity

Kim, Sang Wan; Song, Jae Young; Kim, Jong Pil; Choi, Woo Young; Chung, Han Ki; Park, Jae Hyun; Ko, Hyungsoo; et al, IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008, IEEE, 2008-06

11
Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)

Shin, Hyunjung; Lee, Bongki; Kim, Chanhyung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; Hong, Seungbum; et al, ELECTRONIC MATERIALS LETTERS, v.1, no.2, pp.127 - 133, 2005-12

12
Memory effect of a single-walled carbon nanotube on nitride-oxide structure under various bias conditions

Park, Hongsik; Shin, Hyunjung; Kim, Jin Ho; Hong, Seungbum; Xu, Jimmy, APPLIED PHYSICS LETTERS, v.96, no.2, 2010-01

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