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Showing results 1 to 5 of 5

1
A new resistive probe with higher resolution

Lee, Jaehong; Hong, Daniel Seungbum; Jung, Juhwan; Park, Byung-Gook; Lee, Jong Duk; Shin, Hyungcheol, 2006 IEEE Nanotechnology Materials and Devices Conference, pp.114 - 115, IEEE Nanotechnology Council, 2006-10

2
Analysis and modeling of resistive probes

Kim, Sang Wan; Hong, Daniel Seungbum; Choi, Woo Young; Song, Jae Young; Kim, Jong Pil; Kim, Junsoo; Ko, Hyoungsoo; et al, 2006 IEEE Nanotechnology Materials and Devices Conference, IEEE Nanotechnology Council, 2006-10

3
Characterization of sensitivity and resolution of silicon resistive probe

Kim, Junsoo; Lee, Jaehong; Song, Ickhyun; Lee, Jong Duk; Park, Byung-Gook; Hong, Seungbum; Ko, Hyoungsoo; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.3, pp.1717 - 1722, 2008-03

4
Investigation of resistive probes with high sensitivity

Kim, Sang Wan; Hong, Daniel Seungbum; Song, Jae Young; Kim, Jong Pil; Choi, Woo Young; Chung, Han Ki; Park, Jae Hyun; et al, Silicon Nanoelectronics Workshop, 2008

5
Investigation of resistive probes with high sensitivity

Kim, Sang Wan; Song, Jae Young; Kim, Jong Pil; Choi, Woo Young; Chung, Han Ki; Park, Jae Hyun; Ko, Hyungsoo; et al, IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008, IEEE, 2008-06

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