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Showing results 1 to 10 of 10

1
Double-layered passivation film structure of Al2O3/SiNx for high mobility oxide thin film transistors

Park, Sang-Hee Ko; Ryu, Min-Ki; Oh, Himchan; Hwang, Chi-Sun; Jeon, Jae-Hong; Yoon, Sung-Min, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.31, no.2, 2013-03

2
Enhanced bias illumination stability of oxide thin film transistor through insertion of ultrathin positive charge barrier into active material

Oh, Himchan; Park, Sang-Hee Ko; Hwang, Chi-Sun; Yang, Shinhyuk; Ryu, Min Ki, APPLIED PHYSICS LETTERS, v.99, no.2, 2011-07

3
Improved Stability of Atomic Layer Deposited ZnO Thin Film Transistor by Intercycle Oxidation

Oh, Himchan; Park, Sang-Hee Ko; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Kwon, Oh Sang, ETRI JOURNAL, v.34, no.2, pp.280 - 283, 2012-04

4
Low-Temperature Processed Flexible In-Ga-Zn-O Thin-Film Transistors Exhibiting High Electrical Performance

Yang, Shinhyuk; Bak, Jun Yong; Yoon, Sung-Min; Ryu, Min Ki; Oh, Himchan; Hwang, Chi-Sun; Kim, Gi Heon; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.12, pp.1692 - 1694, 2011-12

5
Nonvolatile memory thin-film transistors using an organic ferroelectric gate insulator and an oxide semiconducting channel

Yoon, Sung-Min; Yang, Shinhyuk; Byun, Chun-Won; Jung, Soon-Won; Ryu, Min-Ki; Park, Sang-Hee Ko; Kim, ByeongHoon; et al, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.26, no.3, 2011-03

6
Photon-accelerated negative bias instability involving subgap states creation in amorphous In-Ga-Zn-O thin film transistor

Oh, Himchan; Yoon, Sung-Min; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Park, Sang-Hee Ko, APPLIED PHYSICS LETTERS, v.97, no.18, 2010-11

7
The role of passivation layer during thermal annealing for oxide semiconductor thin films

Hwang, Chi-Sun; Park, Sang-Hee Ko; Cho, Sung-Heang; Ryu, Min Ki; Oh, Himchan; Lee, Su Jae; Yang, Jong-Heon; et al, 12th Symposium on Thin Film Transistor Technologies, TFT 2014 - 2014 ECS and SMEQ Joint International Meeting, pp.115 - 121, Electrochemical Society Inc., 2014-10

8
Transition of dominant instability mechanism depending on negative gate bias under illumination in amorphous In-Ga-Zn-O thin film transistor

Oh, Himchan; Yoon, Sung-Min; Ryu, Min Ki; Hwang, Chi-Sun; Yang, Shinhyuk; Park, Sang-Hee Ko, APPLIED PHYSICS LETTERS, v.98, no.3, 2011-01

9
Unusual instability mode of transparent all oxide thin film transistor under dynamic bias condition

Oh, Himchan; Hwang, Chi-Sun; Pi, Jae-Eun; Ryu, Min Ki; Park, Sang-Hee Ko; Chu, Hye Yong, APPLIED PHYSICS LETTERS, v.103, no.12, 2013-09

10
Vertical Channel ZnO Thin-Film Transistors Using an Atomic Layer Deposition Method

Hwang, Chi-Sun; Park, Sang-Hee Ko; Oh, Himchan; Ryu, Min-Ki; Cho, Kyoung-Ik; Yoon, Sung-Min, IEEE ELECTRON DEVICE LETTERS, v.35, no.3, pp.360 - 362, 2014-03

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