Browse "Dept. of Materials Science and Engineering(신소재공학과)" byAuthorFelfer, Peter J.

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Mining information from atom probe data

Cairney, Julie M.; Rajan, Krishna; Haley, Daniel; Gault, Baptiste; Bagot, Paul A.J.; Choi, Pyuck-Paresearcher; Felfer, Peter J.; et al, ULTRAMICROSCOPY, v.159, pp.324 - 337, 2015-12

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