Showing results 14 to 16 of 16
The link between crack velocity and rupture time in creeping solids Yu, Jin, ENGINEERING FRACTURE MECHANICS, v.53, no.2, pp.213 - 230, 1996 |
Transmission electron microscopy study of SiF+/BF2+ implanted and annealed (100)Si: Amorphization and residual effects Kim, JH; Lee, JeongYong; Paik, JC; Kim, HJ, JOURNAL OF APPLIED PHYSICS, v.79, no.10, pp.7549 - 7554, 1996-05 |
Trench-Structured High-Current-Driving Aluminum-Doped Indium-Tin-Zinc Oxide Semiconductor Thin-Film Transistor Kim, Do Hyung; Lee, Kwang-Heum; Lee, Seung Hee; Kim, Junsung; Yang, Junghoon; Kim, Jingyu; Cho, Seong-In; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.10, pp.1677 - 1680, 2022-10 |
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