Showing results 1 to 16 of 16
Communication-In-Line Detection of Silicon Surface Quality Variation Using Surface Photovoltage and Room Temperature Photoluminescence Measurements Kim, Jae Hyun; Han, Seung Min; Yoo, Woo Sik, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.5, no.7, pp.P438 - P440, 2016-06 |
Cracking of densely coated layer adhesively bonded to porous substrates under Hertzian stress Lee, Kee Sung; Kim, Sang Kyum; Kim, Chul; Kim, Tae Woo; Kim, Do Kyung, JOURNAL OF MATERIALS SCIENCE, v.42, no.21, pp.9116 - 9120, 2007-11 |
Degradation of polymer electrolyte membrane fuel cells repetitively exposed to reverse current condition under different temperature Jo, Yoo Yeon; Cho, EunAe; Kim, Jung Hyeun; Lim, Tae-Hoon; Oh, In-Hwan; Kim, Soo-Kil; Kim, Hyung-Juhn; et al, JOURNAL OF POWER SOURCES, v.196, no.23, pp.9906 - 9915, 2011-12 |
Development of a Durable PEMFC Startup Process by Applying a Dummy Load Kim, Jae Hong; Cho, Eun Ae; Jang, Jong Hyun; Kim, Hyoung Juhn; Lim, Tae-Hoon; Oh, In-Hwan; Ko, Jae Jun; et al, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.156, no.8, pp.955 - 961, 2009 |
Direct Visualization of Cross-Sectional Strain Distribution in Flexible Devices Lee, Tae-Ik; Jo, Woosung; Kim, Wansun; Kim, Ji-Hye; Paik, Kyung-Wook; Kim, Taek-Soo, ACS APPLIED MATERIALS & INTERFACES, v.11, no.14, pp.13416 - 13422, 2019-04 |
Effect of flaw state on the strength of brittle coatings on soft substrates Kim, HW; Deng, Y; Miranda, P; Pajares, A; Kim, Do Kyung; Kim, HE; Lawn, BR, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.84, no.10, pp.2377 - 2384, 2001-10 |
Effect of the microstructureOf Si3N4 on the adhesion strength of TiN film on Si3N4 Kim, YG; Tatami, J; Komeya, K; Kim, Do Kyung, THIN SOLID FILMS, v.510, pp.222 - 228, 2006-07 |
Effects of Pt loading in the anode on the durability of a membrane-electrode assembly for polymer electrolyte membrane fuel cells during startup/shutdown cycling Eom, KwangSup; Kim, GyeongHee; Cho, EunAe; Jang, Jong Hyun; Kim, Hyoung-Juhn; Yoo, Sung Jong; Kim, Soo-Kil; et al, INTERNATIONAL JOURNAL OF HYDROGEN ENERGY, v.37, no.23, pp.18455 - 18462, 2012-12 |
Effects of residual oxygen partial pressure on the degradation of polymer electrolyte membrane fuel cells under reverse current conditions Eom, KwangSup; Jo, Yoo Yeon; Cho, EunAe; Lim, Tae-Hoon; Jang, Jong Hyun; Kim, Hyoung-Juhn; Hong, Bo Ki; et al, JOURNAL OF POWER SOURCES, v.198, no.1, pp.42 - 50, 2012-01 |
Enhanced interfacial adhesion of patterned Cu-graphene nanolayered composite Kim, Wonsik; Kim, Sang Min; Han, Seung Min, SCRIPTA MATERIALIA, v.241, 2024-03 |
Investigation on fracture behavior of armor ceramics against HEAT penetration Shin, HS; Oh, SY; Kim, Do Kyung; Kim, CW; Chang, SN, INTERNATIONAL JOURNAL OF IMPACT ENGINEERING, v.29, pp.631 - 638, 2003-12 |
Rate effects in critical loads for radial cracking in ceramic coatings Lee, CS; Kim, Do Kyung; Sanchez, J; Miranda, P; Pajares, A; Lawn, BR, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.85, no.8, pp.2019 - 2024, 2002-08 |
Strength measurement of a brittle coating with a trilayer structure using instrumented indentation and in situ observation techniques Kim, JH; Leey, HK; Kim, Do Kyung, PHILOSOPHICAL MAGAZINE, v.86, pp.5383 - 5396, 2006-11 |
The link between crack velocity and rupture time in creeping solids Yu, Jin, ENGINEERING FRACTURE MECHANICS, v.53, no.2, pp.213 - 230, 1996 |
Transmission electron microscopy study of SiF+/BF2+ implanted and annealed (100)Si: Amorphization and residual effects Kim, JH; Lee, JeongYong; Paik, JC; Kim, HJ, JOURNAL OF APPLIED PHYSICS, v.79, no.10, pp.7549 - 7554, 1996-05 |
Trench-Structured High-Current-Driving Aluminum-Doped Indium-Tin-Zinc Oxide Semiconductor Thin-Film Transistor Kim, Do Hyung; Lee, Kwang-Heum; Lee, Seung Hee; Kim, Junsung; Yang, Junghoon; Kim, Jingyu; Cho, Seong-In; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.10, pp.1677 - 1680, 2022-10 |
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