Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Type Article
Showing results 841 to 860 of 7256
| Characterization of a cube textured CU2O buffer layer on Cu tapes for YBCO coated conductors Kim, YH; Sung, TH; Han, SC; Han, YH; Jeong, NH; No, Kwangsoo, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.17, pp.3616 - 3619, 2007-06 |
| Characterization of a molybdenum electrode deposited by sputtering and its effect on Cu(In,Ga)Se-2 solar cells Yoon, KH; Kim, SK; Chalapathy, RBV; Yun, JH; Lee, JC; Song, J; Ahn, Byung Tae, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.1114 - 1118, 2004-10 |
| Characterization of Ag-x(Ge2Sb2Te5)(1-x) thin film by RF magnetron sputtering Kim, Dong Hun; Kim, Myung Sun; Kim, Ran-Young; Kim, Kyung Sun; Kim, Ho Gi, MATERIALS CHARACTERIZATION, v.58, no.5, pp.479 - 484, 2007 |
| Characterization of an In2Se3 Passivation Layer for CIGS Solar Cells with Cd-free Zn-containing Atomic-layer-deposited Buffers 김선철; 이호진; 안병태; 김기환; 윤재호; 신동협, Current Photovoltaic Research, v.9, no.3, pp.96 - 105, 2021 |
| CHARACTERIZATION OF AZ PN114 RESIST FOR SOFT-X-RAY PROJECTION LITHOGRAPHY EARLY, K; TENNANT, DM; Jeon, DukYoung; MULGREW, PP; MACDOWELL, AA; WOOD, OR; KUBIAK, GD; et al, APPLIED OPTICS, v.32, no.34, pp.7044 - 7049, 1993-12 |
| Characterization of basal plane dislocations in PVT-grown SiC by transmission electron microscopy Jeong, Myoungho; Kim, Dong-Yeob; Hong, Soon-Ku; Lee, Jeong Yong; Yeo, Im Gyu; Eun, Tai-Hee; Chun, Myoung-Chuel, KOREAN JOURNAL OF MATERIALS RESEARCH, v.26, no.11, pp.656 - 661, 2016-11 |
| Characterization of CeO2 thin films as insulator of metal ferroelectric insulator semiconductor (MFIS) structures Song, HW; Lee, CS; Kim, DG; No, Kwangsoo, THIN SOLID FILMS, v.368, no.1, pp.61 - 66, 2000 |
| Characterization of co-sputtered Cu-In alloy precursors for CuInSe2 thin films fabrication by close-spaced selenization Adurodija, FO; Kim, SK; Kim, SD; Song, JS; Yoon, KH; Ahn, Byung Tae, SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.55, no.3, pp.225 - 236, 1998-10 |
| Characterization of Cu(In,Ga)3Se5 thin film for top cell in CIGS tandem solar cells Kim, KH; Ahn, Byung Tae; Kwon, SH; Yun, JH; Yoon, KH, DIFFUSION AND DEFECT DATA PT.B: SOLID STATE PHENOMENA, v.124-126, no.PART 2, pp.959 - 962, 2007 |
| Characterization of Cu(In,Ga)Se-2 Solar Cells Grown on Na-Free Glass with an NaF Layer on a Mo Film Shin, Young Min; Lee, Chang Soo; Shin, Dong Hyeop; Ko, Young Min; Al-Ammar, Essam A.; Kwon, Hyuk-Sang; Ahn, Byung Tae, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, v.2, no.6, pp.P248 - P252, 2013 |
| Characterization of Cu(In1-xGax)Se-2 films prepared by three-stage coevaporation and their application to CIGS solar cells for a 14.48 % efficiency Kwon, SH; Lee, DY; Ahn, Byung Tae; Yoon, KH; Song, J, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.39, no.4, pp.660 - 1, 2001-10 |
| Characterization of Cu-poor surface on Cu-rich CuInSe2 film prepared by evaporating binary selenide compounds and its effect on solar efficiency Lee, DY; Yun, JH; Yoon, KH; Ahn, Byung Tae, THIN SOLID FILMS, v.410, no.1-2, pp.171 - 176, 2002-05 |
| Characterization of Cu2ZnSnSe4 Thin Films Selenized with Cu2-xSe/SnSe2/ZnSe and Cu/SnSe2/ZnSe Stacks Ahn, Byung Tae; Munir, Rahim; Jung, Gwang Sun; Ko, Young Min, 한국재료학회지, v.23, no.3, pp.183 - 189, 2013-03 |
| Characterization of CuInSe2 and InxSey thin films by coevaporation method Kwon, SH; Ahn, Byung Tae; Kim, SK; Adurodija, F; Kang, KH; Yoon, KH; Song, JS, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.31, no.5, pp.796 - 801, 1997-11 |
| Characterization of deep levels in a-plane GaN epi-layers grown using various growth techniques Song, Hoo-Young; Kim, Eun-Kyu; Baik, Kwang-Hyeon; Hwang, Sung-Min; Jang, Yong-Woon; Lee, Jeong-Yong, JOURNAL OF CRYSTAL GROWTH, v.340, no.1, pp.23 - 27, 2012-02 |
| Characterization of elastic moduli of Cu thin films using nanoindentation technique Hong, Soon-Hyung; Kim, KS; Kim, YM; Hahn, JH; Lee, CS; Park, JH, COMPOSITES SCIENCE AND TECHNOLOGY, v.65, pp.1401 - 1408, 2005-07 |
| Characterization of Eu-doped SnO2 thin films deposited by radio-frequency sputtering for a transparent conductive phosphor layer Park, DH; Cho, YH; Do, YR; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.153, no.4, pp.63 - 67, 2006 |
| Characterization of femtosecond-laser-ablated a germanium single crystal in air by using X-ray diffraction Park, MI; Park, Chong-Ook; Kim, CS; Jeoung, SC, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.46, no.2, pp.531 - 535, 2005-02 |
| Characterization of Ge1-xTex chalcogenide thin films deposited by MOCVD for phase change memory applications Kim, Ran-Young; Kim, Ho Gi; Yoon, Soon-Gil, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.155, no.2, pp.D137 - D140, 2008 |
| Characterization of Grain Boundaries in Cu(In,Ga)Se-2 Films Using Atom-Probe Tomography Cojocaru-Miredin, Oana; Choi, Pyuck-Pa; Abou-Ras, Daniel; Schmidt, Sebastian S.; Caballero, Raquel; Raabe, Dierk, IEEE JOURNAL OF PHOTOVOLTAICS, v.1, no.2, pp.207 - 212, 2011-10 |
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