Scanning Photoemission Microscopy of Graphene Sheets on SiO2

Abstract

Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C Is core level spectra for the mono- and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphenes through the chemical contrast images of SPEM.