An Electrical Particle Velocity Profiler Using Three Electrode Lines with Unevenly Divided Inter-electrode Gaps
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Taeyoon | - |
| dc.contributor.author | Cho, Young-Ho | - |
| dc.date.accessioned | 2013-03-27T10:34:42Z | - |
| dc.date.available | 2013-03-27T10:34:42Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2007-08-30 | - |
| dc.identifier.citation | Proc. 5th Inter. Nanotech Symposium, v., no., pp.PPH020 - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/161689 | - |
| dc.language | ENG | - |
| dc.title | An Electrical Particle Velocity Profiler Using Three Electrode Lines with Unevenly Divided Inter-electrode Gaps | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | PPH020 | - |
| dc.citation.publicationname | Proc. 5th Inter. Nanotech Symposium | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Cho, Young-Ho | - |
| dc.contributor.nonIdAuthor | Kim, Taeyoon | - |
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