Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject beta mixture model▼aconvolutional neural networks▼adeep learning▼alabel noise▼awafer bin map
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| Noisy label correction for classification of wafer bin maps with mixed-type defect patterns = 웨이퍼 결함 패턴 분류를 위한 라벨 노이즈에 강건한 심층 학습법 연구link Kim, Sumin; Kim, Heeyoung; et al, 한국과학기술원, 2021 |
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