Browse "Dept. of Industrial and Systems Engineering(산업및시스템공학과)" by Subject 합성곱 신경망▼a결합된 메모리▼a결함 패턴 분류▼a클래스 불균형▼a웨이퍼빈맵▼a반도체공정
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| Memory-augmented convolutional neural networks with triplet loss for imbalanced wafer defect pattern classification = 메모리가 결합된 합성곱 신경망을 이용한 불균형 웨이퍼 결함 패턴 분류link Hyun, Yunseung; Kim, Heeyoung; et al, 한국과학기술원, 2020 |
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