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수리횟수 및 불량 주변 칩 수를 고려한 결함내성 메모리 반도체의 번인정책에 관한 연구 = Development of burn-in policies for defect tolerant memory products considering the number of repairs and defective neighborhood chipslink

동승훈; Tong, Seung-Hoon; et al, 한국과학기술원, 2006

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