Investigation of Gate Misalignment Effects in FinFETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Yang-Kyu | - |
| dc.contributor.author | Kim, Kuk-Hwan | - |
| dc.contributor.author | Han, Jin-Woo | - |
| dc.date.accessioned | 2013-03-18T11:09:58Z | - |
| dc.date.available | 2013-03-18T11:09:58Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 2006-07 | - |
| dc.identifier.citation | Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, v., no., pp.179 - 184 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/147757 | - |
| dc.language | ENG | - |
| dc.title | Investigation of Gate Misalignment Effects in FinFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 179 | - |
| dc.citation.endingpage | 184 | - |
| dc.citation.publicationname | Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.identifier.conferencecountry | Japan | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.nonIdAuthor | Kim, Kuk-Hwan | - |
| dc.contributor.nonIdAuthor | Han, Jin-Woo | - |
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