Investigation of Gate Misalignment Effects in FinFETs

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 300
  • Download : 0
Issue Date
2006-07
Language
ENG
Citation

Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, pp.179 - 184

URI
http://hdl.handle.net/10203/147757
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0