Surface Charge Variation of Nano Particles with High Aspect Ratio: A SANS Study

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dc.contributor.authorKim, Tae-Hwan-
dc.contributor.authorChoi, SungMin-
dc.contributor.authorKline, Steven R.-
dc.date.accessioned2013-03-18T10:12:05Z-
dc.date.available2013-03-18T10:12:05Z-
dc.date.created2012-02-06-
dc.date.issued2005-04-01-
dc.identifier.citationHANARO 2005, v., no., pp.853 - 856-
dc.identifier.urihttp://hdl.handle.net/10203/147310-
dc.languageKOR-
dc.titleSurface Charge Variation of Nano Particles with High Aspect Ratio: A SANS Study-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage853-
dc.citation.endingpage856-
dc.citation.publicationnameHANARO 2005-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorChoi, SungMin-
dc.contributor.nonIdAuthorKim, Tae-Hwan-
dc.contributor.nonIdAuthorKline, Steven R.-
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NE-Conference Papers(학술회의논문)
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